Accelerated X-Ray Analysis for Nanoscale Imaging (XANI) of Novel Materials

A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors,...

May 14, 2026 - 00:42
 1
Accelerated X-Ray Analysis for Nanoscale Imaging (XANI) of Novel Materials
A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors,...

A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors, batteries, and catalysis. It produces ultrashort X-ray pulses that can record the movements of atoms and electrons. These instruments can detect the smallest change in material structure caused by defects and other influences.

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